搜索包含 Scanning Electron Microscope Symposium (1974) 的图书 - 暨南大学图书馆

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	Constituents of Modern System-safety Thinking [electronic resource] : Proceedings of the Thirteenth Safety-critical Systems Symposium, Southampton, UK, 8鈥ᰠFebruary 2005 0 索取号：作者：Redmill、 Felix.、Anderson、 Tom.、SpringerLink (Online service)、出版社：London : Springer London, 2005.		Biotechnology for Fuels and Chemicals [electronic resource] : Proceedings of the Twenty-Ninth Symposium on Biotechnology for Fuels and Chemicals Held April 29鈥揗ay 2, 2007, in Denver, Colorado 0 索取号：作者：Adney、 William S.、McMillan、 James D.、Mielenz、 Jonathan.、Klasson、 K. Thomas.、SpringerLink (Online service)、出版社：Totowa, NJ : Humana Press, 2008.
	Applied Biochemistry and Biotecnology [electronic resource] : The Twenty-Eighth Symposium Proceedings of the Twenty-Eight Symposium on Biotechnology for Fuels and Chemicals Held April 30鈥揗ay 3, 2006, in Nashville, Tennessee 0 索取号：作者：Mielenz、 Jonathan R.、Klasson、 K. Thomas.、Adney、 William S.、McMillan、 James D.、SpringerLink (Online service)、出版社：Totowa, NJ : Humana Press, 2007.		Twenty-Seventh Symposium on Biotechnology for Fuels and Chemicals [electronic resource] 0 索取号：作者：McMillan、 James D.、Adney、 William S.、Mielenz、 Jonathan R.、Klasson、 K. Thomas.、SpringerLink (Online service)、出版社：Totowa, NJ : Humana Press, 2006.
	Twenty-Sixth Symposium on Biotechnology for Fuels and Chemicals [electronic resource] 0 索取号：作者：Davison、 Brian H.、Evans、 Barbara R.、Finkelstein、 Mark.、McMillan、 James D.、SpringerLink (Online service)、出版社：Totowa, NJ : Humana Press, 2005.		Modeling Nanoscale Imaging in Electron Microscopy [electronic resource] 0 索取号：作者：Vogt、 Thomas.、Dahmen、 Wolfgang.、Binev、 Peter.、SpringerLink (Online service)、出版社：Boston, MA : Springer US, 2012.
	Network Reliability in Practice [electronic resource] : Selected Papers from the Fourth International Symposium on Transportation Network Reliability 0 索取号：作者：Levinson、 David M.、Liu、 Henry X.、Bell、 Michael.、SpringerLink (Online service)、出版社：New York, NY : Springer New York, 2012.		Achieving Systems Safety [electronic resource] : Proceedings of the Twentieth Safety-Critical Systems Symposium, Bristol, UK, 7-9th February 2012 0 索取号：作者：Dale、 Chris.、Anderson、 Tom.、SpringerLink (Online service)、出版社：London : Springer London, 2012.
	Computer and Information Sciences II [electronic resource] : 26th International Symposium on Computer and Information Sciences 0 索取号：作者：Gelenbe、 Erol.、Lent、 Ricardo.、Sakellari、 Georgia.、SpringerLink (Online service)、出版社：London : Springer London, 2012.		Electron Energy-Loss Spectroscopy in the Electron Microscope [electronic resource] 0 索取号：作者：Egerton、 R.F.、SpringerLink (Online service)、出版社：Boston, MA : Springer US, 2011.
	A Search for Muon Neutrino to Electron Neutrino Oscillations in the MINOS Experiment [electronic resource] 0 索取号：作者：Ochoa-Ricoux、 Juan Pedro.、SpringerLink (Online service)、出版社：New York, NY : Springer New York, 2011.		Scanning Transmission Electron Microscopy [electronic resource] : Imaging and Analysis 0 索取号：作者：Pennycook、 Stephen J.、Nellist、 Peter D.、SpringerLink (Online service)、出版社：New York, NY : Springer New York : Imprint: Springer, 2011.
	Scanning Probe Microscopy of Functional Materials [electronic resource] : Nanoscale Imaging and Spectroscopy 0 索取号：作者：Kalinin、 Sergei V.、Gruverman、 Alexei.、SpringerLink (Online service)、出版社：New York, NY : Springer New York, 2011.		Analysis of Excitation and Ionization of Atoms and Molecules by Electron Impact [electronic resource] 0 索取号：作者：Chaudhry、 Afzal.、Kleinpoppen、 Hans.、SpringerLink (Online service)、出版社：New York, NY : Springer New York : Imprint: Springer, 2011.
	Advanced Computing in Electron Microscopy [electronic resource] 0 索取号：作者：Kirkland、 Earl J.、SpringerLink (Online service)、出版社：Boston, MA : Springer US, 2010.		Sample Preparation Handbook for Transmission Electron Microscopy [electronic resource] : Techniques 0 索取号：作者：Ayache、 Jeanne.、Beaunier、 Luc.、Boumendil、 Jacqueline.、Ehret、 Gabrielle.、Laub、 Dani猫le.、SpringerLink (Online service)、出版社：New York, NY : Springer New York : Imprint: Springer, 2010.

	Constituents of Modern System-safety Thinking [electronic resource] : Proceedings of the Thirteenth Safety-critical Systems Symposium, Southampton, UK, 8鈥ᰠFebruary 2005 0 索取号：作者：Redmill、 Felix.、Anderson、 Tom.、SpringerLink (Online service)、出版社：London : Springer London, 2005.		Biotechnology for Fuels and Chemicals [electronic resource] : Proceedings of the Twenty-Ninth Symposium on Biotechnology for Fuels and Chemicals Held April 29鈥揗ay 2, 2007, in Denver, Colorado 0 索取号：作者：Adney、 William S.、McMillan、 James D.、Mielenz、 Jonathan.、Klasson、 K. Thomas.、SpringerLink (Online service)、出版社：Totowa, NJ : Humana Press, 2008.
	Applied Biochemistry and Biotecnology [electronic resource] : The Twenty-Eighth Symposium Proceedings of the Twenty-Eight Symposium on Biotechnology for Fuels and Chemicals Held April 30鈥揗ay 3, 2006, in Nashville, Tennessee 0 索取号：作者：Mielenz、 Jonathan R.、Klasson、 K. Thomas.、Adney、 William S.、McMillan、 James D.、SpringerLink (Online service)、出版社：Totowa, NJ : Humana Press, 2007.		Twenty-Seventh Symposium on Biotechnology for Fuels and Chemicals [electronic resource] 0 索取号：作者：McMillan、 James D.、Adney、 William S.、Mielenz、 Jonathan R.、Klasson、 K. Thomas.、SpringerLink (Online service)、出版社：Totowa, NJ : Humana Press, 2006.
	Twenty-Sixth Symposium on Biotechnology for Fuels and Chemicals [electronic resource] 0 索取号：作者：Davison、 Brian H.、Evans、 Barbara R.、Finkelstein、 Mark.、McMillan、 James D.、SpringerLink (Online service)、出版社：Totowa, NJ : Humana Press, 2005.		Modeling Nanoscale Imaging in Electron Microscopy [electronic resource] 0 索取号：作者：Vogt、 Thomas.、Dahmen、 Wolfgang.、Binev、 Peter.、SpringerLink (Online service)、出版社：Boston, MA : Springer US, 2012.
	Network Reliability in Practice [electronic resource] : Selected Papers from the Fourth International Symposium on Transportation Network Reliability 0 索取号：作者：Levinson、 David M.、Liu、 Henry X.、Bell、 Michael.、SpringerLink (Online service)、出版社：New York, NY : Springer New York, 2012.		Achieving Systems Safety [electronic resource] : Proceedings of the Twentieth Safety-Critical Systems Symposium, Bristol, UK, 7-9th February 2012 0 索取号：作者：Dale、 Chris.、Anderson、 Tom.、SpringerLink (Online service)、出版社：London : Springer London, 2012.
	Computer and Information Sciences II [electronic resource] : 26th International Symposium on Computer and Information Sciences 0 索取号：作者：Gelenbe、 Erol.、Lent、 Ricardo.、Sakellari、 Georgia.、SpringerLink (Online service)、出版社：London : Springer London, 2012.		Electron Energy-Loss Spectroscopy in the Electron Microscope [electronic resource] 0 索取号：作者：Egerton、 R.F.、SpringerLink (Online service)、出版社：Boston, MA : Springer US, 2011.
	A Search for Muon Neutrino to Electron Neutrino Oscillations in the MINOS Experiment [electronic resource] 0 索取号：作者：Ochoa-Ricoux、 Juan Pedro.、SpringerLink (Online service)、出版社：New York, NY : Springer New York, 2011.		Scanning Transmission Electron Microscopy [electronic resource] : Imaging and Analysis 0 索取号：作者：Pennycook、 Stephen J.、Nellist、 Peter D.、SpringerLink (Online service)、出版社：New York, NY : Springer New York : Imprint: Springer, 2011.
	Scanning Probe Microscopy of Functional Materials [electronic resource] : Nanoscale Imaging and Spectroscopy 0 索取号：作者：Kalinin、 Sergei V.、Gruverman、 Alexei.、SpringerLink (Online service)、出版社：New York, NY : Springer New York, 2011.		Analysis of Excitation and Ionization of Atoms and Molecules by Electron Impact [electronic resource] 0 索取号：作者：Chaudhry、 Afzal.、Kleinpoppen、 Hans.、SpringerLink (Online service)、出版社：New York, NY : Springer New York : Imprint: Springer, 2011.
	Advanced Computing in Electron Microscopy [electronic resource] 0 索取号：作者：Kirkland、 Earl J.、SpringerLink (Online service)、出版社：Boston, MA : Springer US, 2010.		Sample Preparation Handbook for Transmission Electron Microscopy [electronic resource] : Techniques 0 索取号：作者：Ayache、 Jeanne.、Beaunier、 Luc.、Boumendil、 Jacqueline.、Ehret、 Gabrielle.、Laub、 Dani猫le.、SpringerLink (Online service)、出版社：New York, NY : Springer New York : Imprint: Springer, 2010.